一种冲击实验的装置

AbstractPortable electronic devices are well known to be susceptible to drop impactwhich can cause various damage modes such as interconnect breakage,batteryseparation in cellular phones,possible cracking along inter-faces.Drop impactperformance of these products is one of important concerns of productdesign.Because of the small size of this type of electronic products,it is veryexpensive,time-consuming and difficult to conduct drop tests to directly detect thefailure mechanisms and identify their drop behaviors.The main content of this paperlists the different programs of the testing machine and analyze the work theory,andreference it ,Which has been inspired by the theory of testing microelectronicproducts impact,and design the basic structure of microelectronics products Drop TestMachine in theory,It is important for the anti-wrestling capacity detection ofmicroelectronic product to do the research.Keyword:microelectronic product;Drop;Test Machine;anti-wrestling;work theory